VLSI testing : digital and mixed analogue/digital techniques / by Stanley L. Hurst.

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Material type: Text

TextLanguage: English Series: Publication details: London : Institution of Electrical Engineers, 2017.Description: xx, 532 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Home library	Call number	Status	Date due	Barcode	Item holds
Technical Reference Book	Central Library, IIT Bhubaneswar	Central Library, IIT Bhubaneswar	621.395 HUR/V (Browse shelf(Opens below))	Checked out	17/09/2024	10752

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Includes bibliographical references and index.

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