VLSI testing : digital and mixed analogue/digital techniques /
Hurst, Stanley L.
VLSI testing : digital and mixed analogue/digital techniques / by Stanley L. Hurst. - London : Institution of Electrical Engineers, 2017. - xx, 532 p. : ill. ; 24 cm. - IEE circuits, devices and systems series ;9 .
Includes bibliographical references and index.
9780852969014 0852969015
Integrated circuits--Very large scale integration--Testing.
VLSI.
621.395 / HUR/V
VLSI testing : digital and mixed analogue/digital techniques / by Stanley L. Hurst. - London : Institution of Electrical Engineers, 2017. - xx, 532 p. : ill. ; 24 cm. - IEE circuits, devices and systems series ;9 .
Includes bibliographical references and index.
9780852969014 0852969015
Integrated circuits--Very large scale integration--Testing.
VLSI.
621.395 / HUR/V