Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein [et al.]
Language: English Publication details: New York : Springer Nature, 2018.Edition: 4th edDescription: xxiii, 550 p. : ill. ; 28 cmISBN:- 9781493966745
- 502.825 GOL/S
Item type | Current library | Home library | Collection | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|
Text Book | Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | SMMME | 502.825 GOL/S (Browse shelf(Opens below)) | Checked out | 17/06/2024 | TB10503 | ||
Text Book | Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | SMMME | 502.825 GOL/S (Browse shelf(Opens below)) | Available | TB10506 | |||
Course Reserve | Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | SMMME | 502.825 GOL/S (Browse shelf(Opens below)) | Not for loan | TB10502 | |||
Text Book | Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | SMMME | 502.825 GOL/S (Browse shelf(Opens below)) | Available | TB10504 | |||
Text Book | Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | SMMME | 502.825 GOL/S (Browse shelf(Opens below)) | Checked out | 02/07/2024 | TB10505 |
Total holds: 0
Including reference and index.
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