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Scanning electron microscopy and X-ray microanalysis /

Goldstein, Joseph I.

Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein [et al.] - 4th ed. - New York : Springer Nature, 2018. - xxiii, 550 p. : ill. ; 28 cm.

Including reference and index.

ISBN: 9781493966745

Dewey Class. No.: 502.825 / GOL/S

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