Digital systems testing and testable design / by Miron. Abramovici.
Material type: TextPublication details: New York : IEEE Press, 1990.Description: xviii, 652 p: illISBN:- 9780780310629
- 621.3815 22 ABR/D
Item type | Current library | Home library | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|
Technical Reference Book | Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | 621.3815 ABR/D (Browse shelf(Opens below)) | Available | 7237 |
Total holds: 1
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621.38133 GON/M Microwave transistor amplifiers : | 621.38133 GON/M Microwave transistor amplifiers : | 621.38133 GON/M Microwave transistor amplifiers : | 621.3815 ABR/D Digital systems testing and testable design / | 621.3815 AGA/D Digital electronics / | 621.3815 ATT/C Circuits and electronics : | 621.3815 BAH/C Control components using Si, GaAs, and GaN technologies / |
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