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Digital systems testing and testable design /

Abramovici, Miron.

Digital systems testing and testable design / by Miron. Abramovici. - New York : IEEE Press, 1990. - xviii, 652 p: ill. ;

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ISBN: 9780780310629

Subjects--Topical Terms:
Digital integrated circuits -- Testing.

Dewey Class. No.: 621.3815 / ABR/D

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