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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / by Michael L. Bushnell and Vishwani D. Agrawal.

By: Contributor(s): Material type: TextTextLanguage: English Publication details: Boston : Kluwer Academic, c2000.Description: xviii, 690 p. : ill. ; 26 cmISBN:
  • 9788132233299
Subject(s): DDC classification:
  • 621.395 BUS/E
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