Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Bushnell, Michael L.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / by Michael L. Bushnell and Vishwani D. Agrawal. - Boston : Kluwer Academic, c2000. - xviii, 690 p. : ill. ; 26 cm.

Includes bibliographical references and index.

9788132233299


Integrated circuits--Very large scale integration--Testing.
Digital integrated circuits--Testing.
Mixed signal circuits--Testing.
Semiconductor storage devices--Testing.

621.395 / BUS/E

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