VLSI testing : digital and mixed analogue/digital techniques / by Stanley L. Hurst.
Material type:
TextLanguage: English Series: Publication details: London : Institution of Electrical Engineers, 2017.Description: xx, 532 p. : ill. ; 24 cmISBN: - 9780852969014
- 0852969015
- 621.395 HUR/V
| Item type | Current library | Home library | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
Technical Reference Book
|
Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | 621.395 HUR/V (Browse shelf(Opens below)) | Checked out | 25/03/2025 | 10752 |
Total holds: 0
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| 621.395 GOP/I Introduction to Digital Microelectronic Circuits / | 621.395 GOP/I Introduction to Digital Microelectronic Circuits / | 621.395 HAC/L Logic synthesis and verification algorithms / | 621.395 HUR/V VLSI testing : digital and mixed analogue/digital techniques / | 621.395 ITO/U Ultra-low voltage nano-scale memories | 621.395 IYE/S Simulating non-linear circuits with Python power electronics : | 621.395 JOH/A Algorithms for VLSI design automation / |
Includes bibliographical references and index.
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