Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein [et al.]
Language: English Publication details: New York : Springer Nature, 2018.Edition: 4th edDescription: xxiii, 550 p. : ill. ; 28 cmISBN:- 9781493966745
- 502.825 GOL/S
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Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | SMMME | 502.825 GOL/S (Browse shelf(Opens below)) | Checked out | 17/06/2024 | TB10503 | |
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Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | SMMME | 502.825 GOL/S (Browse shelf(Opens below)) | Available | TB10506 | ||
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| 502.825 GOL/S Scanning electron microscopy and x-ray microanalysis / | 502.825 GOL/S Scanning electron microscopy and X-ray microanalysis / | 502.825 GOL/S Scanning electron microscopy and X-ray microanalysis / | 502.825 GOL/S Scanning electron microscopy and X-ray microanalysis / | 502.825 GOL/S Scanning electron microscopy and X-ray microanalysis / | 502.825 GOL/S Scanning electron microscopy and X-ray microanalysis / | 503 AGA/S Sāmanya vijnana śabda kosa / |
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