Advanced VLSI design and testability issues / Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra

Contributor(s):

Language: English Publication details: Boca Raton : CRC Press, 2021.Description: xvii, 359 p. : ill. ; 23 cmISBN:

Subject(s):

DDC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Home library	Collection	Call number	Status	Date due	Barcode	Item holds
Technical Reference Book	Central Library, IIT Bhubaneswar	Central Library, IIT Bhubaneswar	SES	621.395 TRI/A (Browse shelf(Opens below))	Checked out	18/05/2024	10333

Total holds: 0

Including reference and index.

There are no comments on this title.

to post a comment.