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Advanced VLSI design and testability issues /

Advanced VLSI design and testability issues / Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra - Boca Raton : CRC Press, 2021. - xvii, 359 p. : ill. ; 23 cm.

Including reference and index.

ISBN: 9780367538361

Subjects--Topical Terms:
Integrated circuits
Electronics Microstructure

Dewey Class. No.: 621.395 / TRI/A

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