| 000 | 00742cam a22002294a 4500 | ||
|---|---|---|---|
| 001 | 11188 | ||
| 003 | IN-BhIIT | ||
| 005 | 20250328120947.0 | ||
| 008 | 030226s2003 nyua b 001 0 eng | ||
| 020 | _a9780521822817 (hbk.) | ||
| 040 | _aIN-BhIIT | ||
| 041 | _aeng | ||
| 082 | 0 | 0 |
_a621.38152 _bFRE/T |
| 100 | 1 |
_aFreund, L. B. _eAuthor _925921 |
|
| 245 | 1 | 0 |
_aThin film materials : _bstress, defect formation, and surface evolution / _cby L.B. Freund, S. Suresh. |
| 260 |
_aCambridge,New York : _bCambridge University Press, _c2003. |
||
| 300 |
_axviii, 750 p. : _bill. ; _c25 cm. |
||
| 504 | _aIncludes bibliographical references and indexes. | ||
| 650 | 0 |
_aThin films. _912147 |
|
| 700 | 1 |
_aSuresh, S. _eJoint author _925922 |
|
| 942 | _cTRB | ||
| 999 |
_c14815 _d14815 |
||