000 | 00788cam a22002534a 4500 | ||
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001 | 10713 | ||
003 | IN-BhIIT | ||
005 | 20240304163458.0 | ||
008 | 020330s2003 nyua b 001 0 eng | ||
020 | _a9780367270124 | ||
040 | _aIN-BhIIT | ||
041 | _aeng | ||
082 | 0 | 0 |
_a620.1121 _bNOD/T |
100 | 1 |
_aNoda, Naotake. _eAuthor _922589 |
|
245 | 1 | 0 |
_aThermal stresses / _cby Naotake Noda, Richard B. Hetnarski, Yoshinobu Tanigawa. |
250 | _a2nd ed. | ||
260 |
_aNew York : _bTaylor & Francis, _c2003. |
||
300 |
_axiv, 493 p. : _bill. ; _c24 cm. |
||
504 | _aIncludes bibliographical references and index. | ||
650 | 0 |
_aThermal stresses. _922590 |
|
700 | 1 |
_aHetnarski, Richard B. _eJoint author _922591 |
|
700 | 1 |
_aTanigawa, Yoshinobu. _eJoint author _922592 |
|
942 | _cTRB | ||
999 |
_c13551 _d13551 |