000 | 00804 a2200253 4500 | ||
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001 | TB10502 | ||
003 | IN-BhIIT | ||
005 | 20240919131653.0 | ||
008 | 221208b |||||||| |||| 00| 0 eng d | ||
020 | _a9781493966745 | ||
040 | _aIN-BhIIT | ||
041 | _aeng | ||
082 |
_a502.825 _bGOL/S |
||
100 |
_aGoldstein, Joseph I. _eAuthor _918876 |
||
245 |
_aScanning electron microscopy and X-ray microanalysis / _cJoseph I. Goldstein [et al.] |
||
250 | _a4th ed. | ||
260 |
_aNew York : _bSpringer Nature, _c2018. |
||
300 |
_axxiii, 550 p. : _bill. ; _c28 cm. |
||
500 | _aIncluding reference and index. | ||
700 |
_aNewbury, Dale E. _eJoint author _918877 |
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700 |
_aMichael, Joseph R. _eJoint author _918878 |
||
700 |
_aRitchie, Nicholas W.M. _eJoint author _918879 |
||
942 |
_cTB _08 |
||
999 |
_c12871 _d12871 |