| 000 | 00821 a2200253 4500 | ||
|---|---|---|---|
| 001 | 10333 | ||
| 003 | IN-BhIIT | ||
| 005 | 20240118124219.0 | ||
| 008 | 230121b |||||||| |||| 00| 0 eng d | ||
| 020 | _a9780367538361 | ||
| 040 | _aIN-BhIIT | ||
| 041 | _aeng | ||
| 082 |
_a621.395 _bTRI/A |
||
| 245 |
_aAdvanced VLSI design and testability issues / _cSuman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra |
||
| 260 |
_aBoca Raton : _bCRC Press, _c2021. |
||
| 300 |
_axvii, 359 p. : _bill. ; _c23 cm. |
||
| 504 | _aIncluding reference and index. | ||
| 650 |
_aIntegrated circuits _922068 |
||
| 650 |
_aElectronics Microstructure _919419 |
||
| 700 |
_aTripathi, Suman Lata _eEditor _919420 |
||
| 700 |
_aSaxena, Sobhit _eEditor _919421 |
||
| 700 |
_aMohapatra, Sushanta Kumar _eEditor _919422 |
||
| 942 |
_cTRB _01 |
||
| 999 |
_c12727 _d12727 |
||