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1.
Digital systems testing and testable design / by Miron. Abramovici. by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : IEEE Press, 1990
Availability: Not available: Central Library, IIT Bhubaneswar: Checked out (1).

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2.
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / by Michael L. Bushnell and Vishwani D. Agrawal. by
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Boston : Kluwer Academic, c2000
Availability: Not available: Central Library, IIT Bhubaneswar: Checked out (3).

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