Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications / by S. Rein.
Material type: TextSeries: (Springer series in materials science ; v. 85)Publication details: Berlin : Springer, 2005.Description: XXVI, 489 p. : illu. ; 24 cmISBN:- 9783540253037 (hbk.)
- 621.3815 REI/L
Item type | Current library | Home library | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Reference Book | Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | 621.3815 REI/L (Browse shelf(Opens below)) | Available | 7785 |
Total holds: 0
There are no comments on this title.