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Scanning electron microscopy and X-ray microanalysis / Joseph I. Goldstein [et al.]

By: Contributor(s): Language: English Publication details: New York : Springer Nature, 2018.Edition: 4th edDescription: xxiii, 550 p. : ill. ; 28 cmISBN:
  • 9781493966745
DDC classification:
  • 502.825 GOL/S
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Holdings
Item type Current library Home library Collection Call number Status Date due Barcode Item holds
Text Book Text Book Central Library, IIT Bhubaneswar Central Library, IIT Bhubaneswar SMMME 502.825 GOL/S (Browse shelf(Opens below)) Checked out 17/06/2024 TB10503
Text Book Text Book Central Library, IIT Bhubaneswar Central Library, IIT Bhubaneswar SMMME 502.825 GOL/S (Browse shelf(Opens below)) Available TB10506
Course Reserve Course Reserve Central Library, IIT Bhubaneswar Central Library, IIT Bhubaneswar SMMME 502.825 GOL/S (Browse shelf(Opens below)) Not for loan TB10502
Text Book Text Book Central Library, IIT Bhubaneswar Central Library, IIT Bhubaneswar SMMME 502.825 GOL/S (Browse shelf(Opens below)) Available TB10504
Text Book Text Book Central Library, IIT Bhubaneswar Central Library, IIT Bhubaneswar SMMME 502.825 GOL/S (Browse shelf(Opens below)) Available TB10505
Total holds: 0

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