Goldstein, Joseph <br/><br/>
Scanning electron microscopy and x-ray microanalysis / 
Joseph I. Goldstein ... [et al.]. 
 - 3rd ed. 
 - New York :  Kluwer Academic/Plenum Publishers,  c2003. 
 - xix, 689 p. :  ill. (some col.) ;  26 cm. +  1 CD-ROM (4 3/4 in.) 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0306472929 
<br/><br/><label>LCCN: </label>2002028276 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy.<br/>X-ray microanalysis.
<br/><br/><label>LC Class. No.: </label>QH212.S3  / S29 2003 
<br/><br/><label>Dewey Class. No.: </label>502.825  / GOL/S