Rein, S. <br/><br/>
Lifetime spectroscopy :   a method of defect characterization in silicon for photovoltaic applications / 
by S. Rein. 
 - Berlin :  Springer,  2005. 
 - XXVI, 489 p. :  illu. ;  24 cm. 
 - (Springer series in materials science,   v. 85) .
<br/><br/><label>ISBN: </label>9783540253037 (hbk.) 
<br/><br/><label>Dewey Class. No.: </label>621.3815  / REI/L