TY  - BOOK
AU  - Abramovici, Miron.
TI  - Digital systems testing and testable design / 
SN  - 9780780310629
U1  - 621.3815 22
PY  - 1990///
CY  - New York : 
PB  - IEEE Press, 
KW  - Digital integrated circuits -- Testing
N1  - Include Index
ER  -