Chen, C. Julian <br/><br/>
Introduction to scanning tunnelling microscopy / 
by C. Julian Chen. 
 - 3rd ed.  
 - New York :  Oxford University Press,  2021. 
 - xxxvii, 452p. :  ill. ;  24 cm 
 - monographs on the physics and chemistry of materials .69 .
<br/><br/>Including special list, reference and index. 
<br/><br/><label>ISBN: </label>9780198856559 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy.<br/>Scanning tunneling microscopy.<br/>SFM (Microscopy).<br/>Scanning probe microscopy.<br/>Scanning force microscopy.<br/>Scanning electron microscopy.<br/>Atomic force microscopy.<br/>Nanometer-Scale Imaging.<br/>Tunneling.
<br/><br/><label>Dewey Class. No.: </label>502.82  / CHE/I