Goldstein, Joseph I.  <br/><br/>
Scanning electron microscopy and X-ray microanalysis / 
Joseph I. Goldstein [et al.] 
 - 4th ed. 
 - New York :  Springer Nature,  2018. 
 - xxiii, 550 p. :  ill. ;  28 cm. 
<br/><br/> Including reference and index. 
<br/><br/><label>ISBN: </label>9781493966745 
<br/><br/><label>Dewey Class. No.: </label>502.825  / GOL/S