TY  - GEN
AU  - Tripathi, Suman Lata 
AU  - Saxena, Sobhit 
AU  - Mohapatra, Sushanta Kumar
TI  - Advanced VLSI design and testability issues
SN  - 9780367538361
U1  - 621.395 
PY  - 2021///
CY  - Boca Raton
PB  - CRC Press
KW  - Integrated circuits
KW  - Electronics Microstructure
N1  - Including reference and index
ER  -