Advanced VLSI design and testability issues / 
Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra 
 - Boca Raton :  CRC Press,  2021. 
 - xvii, 359 p. :  ill. ;  23 cm. 
<br/><br/>Including reference and index. 
<br/><br/><label>ISBN: </label>9780367538361 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits<br/>Electronics Microstructure
<br/><br/><label>Dewey Class. No.: </label>621.395  / TRI/A