TY  - BOOK
AU  - Rein, S.
TI  - Lifetime spectroscopy : : a method of defect characterization in silicon for photovoltaic applications 
SN  - 9783540253037 (hbk.)
U1  - 621.3815 
PY  - 2005///
CY  - Berlin
PB  - Springer
ER  -