Abramovici, Miron. <br/><br/>
Digital systems testing and testable design /    
by Miron. Abramovici. 
 - New York :   IEEE Press,   1990. 
 - xviii, 652 p: ill. ;  
<br/><br/>Include Index 
<br/><br/><label>ISBN: </label>9780780310629   
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits -- Testing.
<br/><br/><label>Dewey Class. No.: </label>621.3815  / ABR/D