TY  - BOOK
AU  - Pecharsky, Vitalij K.
AU  - Zavalij, Peter Y.
TI  - Fundamentals of powder diffraction and structural characterization of materials 
SN  - 9780387095783
CY  - New York
KW  - Powders--Optical properties--Measurement.; X-rays--Diffraction--Measurement.; X-ray crystallography
N1  - Includes bibliographical references and index
ER  -