Bushnell, Michael L. <br/><br/>
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / 
by Michael L. Bushnell and Vishwani D. Agrawal. 
 - Boston :  Kluwer Academic,  c2000. 
 - xviii, 690 p. :  ill. ;  26 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9788132233299 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Testing.<br/>Digital integrated circuits--Testing.<br/>Mixed signal circuits--Testing.<br/>Semiconductor storage devices--Testing.
<br/><br/><label>Dewey Class. No.: </label>621.395  / BUS/E