TY  - BOOK
AU  - Hurst,Stanley L.
TI  - VLSI testing: digital and mixed analogue/digital techniques 
T2  - IEE circuits, devices and systems series ;9
SN  - 9780852969014
U1  - 621.395 
PY  - 2017///
CY  - London
PB  - Institution of Electrical Engineers
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - VLSI
N1  - Includes bibliographical references and index
ER  -