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Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].

By: Contributor(s): Material type: TextTextPublication details: New York : Kluwer Academic/Plenum Publishers, c2003.Edition: 3rd edDescription: xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)ISBN:
  • 0306472929
Subject(s): DDC classification:
  • 502.825 21 GOL/S
LOC classification:
  • QH212.S3 S29 2003
Online resources:
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Item type Current library Home library Call number Status Date due Barcode Item holds
Technical Reference Book Technical Reference Book Central Library, IIT Bhubaneswar Central Library, IIT Bhubaneswar 502.825 GOL/S (Browse shelf(Opens below)) Available 5865
Total holds: 0

Includes bibliographical references and index.

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