Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].

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TextPublication details: New York : Kluwer Academic/Plenum Publishers, c2003.Edition: 3rd edDescription: xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)ISBN:

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Holdings
Item type	Current library	Home library	Call number	Status	Date due	Barcode	Item holds
Technical Reference Book	Central Library, IIT Bhubaneswar	Central Library, IIT Bhubaneswar	502.825 GOL/S (Browse shelf(Opens below))	Available		5865

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Includes bibliographical references and index.

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