Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications / by S. Rein.
Material type:
TextSeries: (Springer series in materials science ; v. 85)Publication details: Berlin : Springer, 2005.Description: XXVI, 489 p. : illu. ; 24 cmISBN: - 9783540253037 (hbk.)
- 621.3815 REI/L
| Item type | Current library | Home library | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
Technical Reference Book
|
Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | 621.3815 REI/L (Browse shelf(Opens below)) | Available | 7785 |
Total holds: 0
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| 621.3815 RAS/E Electronic devices and circuits / | 621.3815 RAS/E Electronic devices and circuits / | 621.3815 RAS/M Microelectronic circuits : analysis and design / | 621.3815 REI/L Lifetime spectroscopy : | 621.3815 RUB/P Phase Noise and Frequency Stability in Oscillators / | 621.3815 RUB/P Phase Noise and Frequency Stability in Oscillators / | 621.3815 SAD/A Advances in silicon carbide processing and applications / |
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