Characterization in compound semiconductor processing / eidted by Yale Strausser and Gary E. McGuire
Material type:
TextSeries: Materials characterization seriesPublication details: Boston : Momentum Press, 1995.Description: xv, 199 p. : ill. ; 24 cmISBN: - 9781606500415
- 621.381 22 MCG/C
| Item type | Current library | Home library | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Technical Reference Book
|
Central Library, IIT Bhubaneswar | Central Library, IIT Bhubaneswar | 621.381 MCG/C (Browse shelf(Opens below)) | Available | 6662 |
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| 621.381 MAL/E Electronic principles / | 621.381 MAR/N Nanotechnology for microelectronics and optoelectronics | 621.381 MAS/S Semiconductor Quantum Dots, Physics, Spectroscopy and Applications | 621.381 MCG/C Characterization in compound semiconductor processing / | 621.381 MOL/W Wireless communication / | 621.381 MOT/A Electronic devices and circuits; an introduction. | 621.381 MOT/A Electronic devices and circuits; an introduction. |
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