Normal view
MARC view
- Digital integrated circuits
Entry Topical Term
001 - CONTROL NUMBER
- control field: 22838
003 - CONTROL NUMBER IDENTIFIER
- control field: IN-BhIIT
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20240320125933.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 240320|| aca||aabn | a|a d
040 ## - CATALOGING SOURCE
- Original cataloging agency: IN-BhIIT
- Transcribing agency: IN-BhIIT
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Digital integrated circuits
- General subdivision: Testing
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: (IN-BhIIT)14121: Bushnell, Michael L. Author 22837, Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /, c2000.