Normal view MARC view ISBD view

Anomalous X-ray scattering for materials characterization

Waseda, Yoshio.

Anomalous X-ray scattering for materials characterization atomic-scale structure determination by Yoshio Waseda. - Berlin Springer 2002

ISBN: 9783540434436

Subjects--Topical Terms:
Material sciences; -ray crystallography.; X-rays -- Scattering

Dewey Class. No.: 539 / WAS/A

Print
Send to device
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)